GEN3 – AutoCAF2+
Measuring device for the detection and monitoring of CAF formation in printed circuit boards
Due to the increasing stress caused by changing temperatures, humidity and various voltages, CAF defects are a serious challenge in the development of printed circuit boards. If CAF formation is detected early, safety risks can be minimised and costs for failures can be reduced. With the AutoCAF2+, test structures with different voltages can be easily and reliably tested for CAF formation. In addition, measurements up to 1,250 volts are possible, in accordance with ISO PASS 19295:2016(E).
Product Features
- measurement time: < 10 seconds to acquire, measure and display all 256 channels
- fast data processing: measurement per channel in less than 15 milliseconds
- possible voltages: + 1 V to 1,250 V
- measuring range: 106 Ohm to 1014 Ohm
- measuring intervals: freely selectable from a minimum of 60 seconds
- shielded measurement cables
- flexible: all existing test specifications of IPC, IEC, JNC or user specifications can be used
- adaptive and flexible software use under Windows 10
Application Areas
- CAF tests on test structures
- high voltage CAF tests
Available Versions
| Type | Measuring Channels |
| AutoCAF2+ 64 | 64 |
| AutoCAF2+ 128 | 128 |
| AutoCAF2+ 256 | 256 |